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IEEE T-ED
No abstract available.
Fabio Carta, Stephen M. Gates, et al.
IEEE T-ED
E. T. Todd Ryan, Stephen M. Gates, et al.
Journal of Applied Physics
F.W. Zeng, Stephen M. Gates, et al.
AIP Advances
C. Michael Greenlief, Stephen M. Gates, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films