E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
A conceptually simple approach is proposed to introduce dissipation into a normal-metal loop penetrated by a flux. The loop is coupled via a single current lead to an electron reservoir. Scattering processes in the loop are elastic. Inelastic processes occur only in the reservoir and are the source of dissipation. We investigate the effect of this reservoir on the persistent currents in the loop and the adsorption of power in the presence of a sinusoidally modulated flux. © 1985 The American Physical Society.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997