The Effect of Silicon Wafer Imperfections on Minority Carrier Generation and Dielectric Breakdown in MOS Structures

F.J. Himpsel, T.A. Jung, et al.

Surface Review and Letters

A. Reisman, M. Berkenblit, et al.

JES

Surendra B. Anantharaman, Joachim Kohlbrecher, et al.

MRS Fall Meeting 2020

E. Burstein

Ferroelectrics