Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry
Paper
The Effect of Silicon Wafer Imperfections on Minority Carrier Generation and Dielectric Breakdown in MOS Structures
Abstract
No abstract available.
Related
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
K.N. Tu
Materials Science and Engineering: A