J.F. Ziegler, J.E.E. Baglin
Journal of Applied Physics
The mechanism of the interaction of polycrystalline Ag-Al thin-film couples to form Ag2Al at temperatures from 107 to 221°C has been studied. Techniques of film characterization included Rutherford backscattering, x-ray diffraction, and SEM. The dependence of the interaction on the grain size of the Ag film (660-7500 Å) was measured. An effective activation energy of 0.86±0.05 eV was found. The reaction is believed to occur initially by nucleation and growth of Ag2Al grains at Ag grain boundaries at the interface; after formation of a continuous Ag2Al layer, the growth of this layer follows a t1/2 law, controlled by diffusion through the grain boundaries of the Ag2Al layer.
J.F. Ziegler, J.E.E. Baglin
Journal of Applied Physics
S. Petersson, J.A. Reimer, et al.
Journal of Applied Physics
T.H. Westmore, J.E.E. Baglin, et al.
MRS Spring Meeting 1998
J.E.E. Baglin, Witold Brostow, et al.
Journal of Materials Education