Structure of the silicon-oxide interface
Yuhai Tu, J. Tersoff
Thin Solid Films
The dependence of cation-substitutional transition-metal impurity levels upon the host semiconductor is calculated self-consistently in a defect-molecule approach. Heterojunction band lineups and Schottky-barrier heights can be calculated within the same tight-binding model. In all three systems, the characteristic behavior is determined by an approximate local charge-neutrality condition imposed by electrostatic self-consistency ("pinning"), with a dangling-bond level playing the role of the "neutrality level." In this way we explain the observed correlation between transition-metal impurity levels, heterojunction band lineups, and Schottky barriers. © 1987 The American Physical Society.
Yuhai Tu, J. Tersoff
Thin Solid Films
J.J. Zhang, A. Rastelli, et al.
Applied Physics Letters
J. Tersoff
Physical Review Letters
F. Legoues, V.P. Kesan, et al.
Physical Review Letters