Aditya Bansal, Keunwoo Kim, et al.
ICICDT 2007
Conference paper
Usage-based degradation of SRAM arrays due to bias temperature instability
Abstract
We propose a novel approach to estimate the workload based degradation of SRAM array stability with time due to NBTI (in PFETs) and PBTI (in NFETs). Goal is to obtain a realistic Vmin guard-band instead of optimistic (alternating stress) or pessimistic (static stress) assumptions. We also represent usage-based approach as stress-corner based approach to simplify the burn-in stress tests. © 2012 IEEE.
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