Circuit and physical design of the zenterprise™ ec12 microprocessor chips and multi-chip module
- James Warnock
- Yuen Chan
- et al.
- 2014
- IEEE Journal of Solid-State Circuits
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25 results for Aditya Bansal
5.5GHz system z microprocessor and multi-chip module
- James Warnock
- Yuen H Chan
- et al.
- 2013
- ISSCC 2013
Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs
- H. Miki
- N. Tega
- et al.
- 2012
- IEDM 2012
Usage-based degradation of SRAM arrays due to bias temperature instability
- Aditya Bansal
- Jae-Joon Kim
- et al.
- 2012
- IRPS 2012
DRC-free high density layout exploration with layout morphing and patterning quality assessment, with application to SRAM
- Amith Singhee
- Emrah Acar
- et al.
- 2012
- ISQED 2012
Evaluation methodology for random telegraph noise effects in SRAM arrays
- M. Yamaoka
- Hiroshi Miki
- et al.
- 2011
- IEDM 2011
Separating NBTI and PBTI effects on the degradation of ring oscillator frequency
- Barry P. Linder
- Jae-Joon Kim
- et al.
- 2011
- IIRW 2011
PBTI/NBTI monitoring ring oscillator circuits with on-chip Vt characterization and high frequency AC stress capability
- Jae-Joon Kim
- Rahul M. Rao
- et al.
- 2011
- VLSI Circuits 2011
Electrical monitoring of gate and active area mask misalignment error
- Aditya Bansal
- Amith Singhee
- et al.
- 2011
- VLSI Circuits 2011
Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011