PaperPicosecond photoemission probing of integrated circuits. Capabilities, limitations, and applicationsR. Clauberg, H. Beha, et al.IBM J. Res. Dev
PaperEnergy and time-resolved photoemission in a promising new approach for contactless integrated-circuit testingH.K. Seitz, A. Blacha, et al.Microelectronic Engineering
PaperDirect and inverse surface photoemission: Sources of ambiguities near the fermi levelR. Clauberg, K.H. Frank, et al.Surface Science
Conference paperPicosecond photoemission sampling for contactless high speed integrated circuit diagnosticsA. Blacha, R. Clauberg, et al.Advances in Semiconductors and Semiconductor Structures 1987
