Contactless high-speed waveform measurements on GaAs integrated circuits with the photoemission sampling technique
- H.K. Seitz
- A. Blacha
- et al.
- 1989
- European Test Conference 1989
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23 results for Hansjörg Beha
Progress in photoemission sampling
- H. Beha
- R. Clauberg
- et al.
- 1989
- CompEuro 1989
Cross-talk and transit-time effects in stroboscopic voltage measurements via electron emission
- R. Clauberg
- A. Blacha
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Fundamentals of laser photoemission for testing high speed devices and circuits
- G.W. Rubloff
- H. Beha
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Picosecond photoemission sampling for contactless high speed integrated circuit diagnostics
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Picosecond photoemission probing of integrated circuits. Capabilities, limitations, and applications
- R. Clauberg
- H. Beha
- et al.
- 1990
- IBM J. Res. Dev
Contactless, high-speed: Waveform measurements on gallium arsenide ICs
- H.K. Seitz
- A. Blacha
- et al.
- 1990
- IEEE Design and Test of Computers
Laser-beam photoemission testing of ultrafast integrated circuits
- R. Clauberg
- H. Beha
- 1989
- Mikroelektronik
Photoemission sampling technique for high-speed integrated-circuit testing
- H. Beha
- H.K. Seitz
- et al.
- 1987
- Microelectronic Engineering
17ps rise-time measurement by photoemission sampling
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Electronics Letters