CMOS logic device and circuit performance of Si gate all around nanowire MOSFET
- Kaushik Nayak
- Mohit Bajaj
- et al.
- 2014
- IEEE T-ED
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86 results for Phil Oldiges
Ab initio study of metal grain orientation-dependent work function and its impact on FinFET variability
- Samarth Agarwal
- Rajan Kumar Pandey
- et al.
- 2013
- IEEE T-ED
Meeting the challenge of multiple threshold voltages in highly scaled undoped FinFETs
- Ramachandran Muralidhar
- Jin Cai
- et al.
- 2013
- IEEE T-ED
Suppression of boron diffusion in deep submicron devices
- Michael A. Gribelyuk
- Phil Oldiges
- et al.
- 2011
- Journal of Vacuum Science and Technology B
Characterization of parasitic bipolar transistors in 45 nm silicon-on-insulator technology
- Larry Wissel
- Phil Oldiges
- et al.
- 2010
- IEEE TNS
Crystallographic-orientation-dependent gate-induced drain leakage in nanoscale MOSFETs
- Rajan K. Pandey
- Kota V. R. M. Murali
- et al.
- 2010
- IEEE T-ED
Intrinsic effective mobility extraction with extremely scaled gate dielectrics
- Zuoguang Liu
- Dechao Guo
- et al.
- 2010
- Applied Physics Letters
Design implications of single event transients in a commercial 45 nm SOI device technology
- Aj Kleinosowski
- Ethan H. Cannon
- et al.
- 2008
- IEEE TNS
Alpha-particle-induced upsets in advanced CMOS circuits and technology
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev
Circuit design and modeling for soft errors
- A.J. KleinOsowski
- Ethan H. Cannon
- et al.
- 2008
- IBM J. Res. Dev