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J.M.C. Stork- Joachim N. Burghartz
- John D. Cressler
- et al.
- 1992
- IEEE Electron Device Letters
- C.T. Chuang
- Ken Chin
- et al.
- 1992
- IEEE Journal of Solid-State Circuits
- Emmanuel F. Crabbé
- James H. Comfort
- et al.
- 1992
- IEEE Electron Device Letters
- E.F. Crabbé
- D.L. Harame
- et al.
- 1992
- IEEE T-ED
- J.H. Comfort
- E.F. Crabbe
- et al.
- 1991
- IEDM 1991
- John D Cressler
- Emmanuel F Crabe
- et al.
- 1991
- IEDM 1991
- J.N. Burghartz
- J.D. Cressler
- et al.
- 1991
- ESSDERC 1991
- J.Y.-C. Sun
- J.H. Comfort
- et al.
- 1991
- VLSI-TSA 1991
- Sophie Verdonckt-Vandebroek
- Emmanuel F. Crabbé
- et al.
- 1991
- IEEE Electron Device Letters
- Maurizio Arienzo
- Subramanian S. Iyer
- et al.
- 1991
- Applied Surface Science