Interface state capture cross section measurements on vacuum annealed and radiation damaged Si:SiO2 surfaces
- M.J. Uren
- V. Nayar
- et al.
- 1998
- JES
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4 results for M.J. Uren
Potential fluctuations due to Pb centres at the Si/SiO2 interface
- M.J. Uren
- K.M. Brunson
- et al.
- 1997
- Microelectronic Engineering
Conductance measurements on Pb centers at the (111) Si:SiO2 interface
- M.J. Uren
- J.H. Stathis
- et al.
- 1996
- Journal of Applied Physics
Intersubband resonances in sosmos accumulation layers
- M.J. Uren
- T.N. Theis
- et al.
- 1983
- Solid State Communications