Design for signal integrity: The new paradigm for deep-submicron VLSI design
- Howard H. Chen
- L.K. Wang
- 1997
- VLSI-TSA 1997
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35 results for L.K. Wang
Simultaneous switching noise projection for high-performance SOI chip design
- L.K. Wang
- Howard H. Chen
- 1996
- IEEE International SOI Conference 1996
On-chip decoupling capacitor design to reduce switching-noise-induced instability in CMOS/SOI VLSI
- L.K. Wang
- Howard H. Chen
- 1995
- IEEE International SOI Conference 1995
Temperature sensitivity of devices and circuits fabricated in fully depleted accumulation mode CMOS/SOI
- F.T. Brady
- N. Haddad
- et al.
- 1992
- IEEE International SOI Conference 1992
Hot-carrier reliability of fully depleted accumulation mode SOI MOSFETS
- A. Acovic
- L.K. Wang
- et al.
- 1992
- IEEE International SOI Conference 1992
Effect of total dose radiation on device self latch-up
- F.T. Brady
- N. Haddad
- et al.
- 1992
- IEEE International SOI Conference 1992
A 0.5 μm fully scaled two-level metal fully planarized interconnect structure fabricated with X-ray lithography
- D. Moy
- L.K. Wang
- et al.
- 1990
- VLSI Technology 1990
0.5 μm CMOS devices and circuits fabricated using synchrotron X-ray lithography
- L.K. Wang
- C.H. Hsu
- et al.
- 1989
- VLSI Technology 1989
Hot-carrier induced instability of 0.5 μm CMOS devices patterned using synchrotron X-ray lithography
- C.C.-H. Hsu
- L.K. Wang
- et al.
- 1989
- IRPS 1989
Fully scaled 0.5 micron CMOS technology using variable shaped electron beam lithography
- Philip Coane
- Paul Rudeck
- et al.
- 1989
- Proceedings of SPIE 1989