Luminescence, Spectroscopy and Composition Fluctuations in (110) Cross Sections of AIGaAs Multilayers
- S.F. Alvarado
- H. Salemink
- et al.
- 1992
- IPR 1992
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9 results for O. Albrektsen
Applications of scanning tunneling microscopy to the characterization of semiconductor technologies and devices
- H. Salemink
- O. Albrektsen
- 1991
- ESSDERC 1991
Investigation of gallium arsenide multilayer structures using a tunnelling microscope combined with a UHV‐SEM
- O. Albrektsen
- H. Salemink
- 2004
- Surface and Interface Analysis
Cross-sectional STM on superlattices and the effect of doping
- H. Salemink
- M. Johnson
- et al.
- 1994
- Solid State Electronics
Terracing and step bunching in interfaces of molecular beam epitaxy-grown (Al)GaAs multilayers
- O. Albrektsen
- H.P. Meier
- et al.
- 1993
- Applied Physics Letters
Direct imaging of dopants in GaAs with cross-sectional scanning tunneling microscopy
- M. Johnson
- O. Albrektsen
- et al.
- 1993
- Applied Physics Letters
Atomic-scale composition fluctuations in III-V semiconductor alloys
- H. Salemink
- O. Albrektsen
- 1993
- Physical Review B
Tunneling spectroscopy across GaAs/AlxGa1-xAs interfaces at nanometer resolution
- H. Salemink
- O. Albrektsen
- et al.
- 1992
- Physical Review B
Tunneling microscopy and spectroscopy of molecular beam epitaxy grown GaAs-AlGaAs interfaces
- O. Albrektsen
- D.J. Arent
- et al.
- 1990
- Applied Physics Letters