Electrostatic discharge protection in silicon-on-insulator technology
- S. Voldman
- D. Hui
- et al.
- 1999
- IEEE International SOI Conference 1999
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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4 results for Vaughn P. Gross
CMOS-on-SOI ESD protection networks
- S. Voldman
- R. Schulz
- et al.
- 1998
- Journal of Electrostatics
Shallow trench isolation double-diobe electrostatic discharge circuit and interaction with DRAM output circuitry
- Steven H. Voldman
- Vaughn P. Gross
- et al.
- 1993
- Journal of Electrostatics
Suppression of particle generation in a modified clean room corona air ionizer
- Philip C.D. Hobbs
- Vaughn P. Gross
- et al.
- 1990
- Journal of Aerosol Science