T. Schneider, E. Stoll
Physical Review B
ESD robustness of 4 kV HBM is achieved in CMOS-on-SOI ESD protection networks in an advanced sub-0.25 μm mainstream CMOS-on-SOI technology. Design layout, body contact, floating-gate effects and novel ESD protection implementations are discussed. © 1998 Elsevier Science B.V.
T. Schneider, E. Stoll
Physical Review B
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
M. Hargrove, S.W. Crowder, et al.
IEDM 1998
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures