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Surface Science
ESD robustness of 4 kV HBM is achieved in CMOS-on-SOI ESD protection networks in an advanced sub-0.25 μm mainstream CMOS-on-SOI technology. Design layout, body contact, floating-gate effects and novel ESD protection implementations are discussed. © 1998 Elsevier Science B.V.
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
K.N. Tu
Materials Science and Engineering: A
David B. Mitzi
Journal of Materials Chemistry
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Solid State Communications