Resolution test for apertureless near-field optical microscopy
- Yves C. Martin
- H. Kumar Wickramasinghe
- 2002
- Journal of Applied Physics
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56 results for Yves Martin
Automated search method for AFM and profilers
- Michael Ray
- Yves C. Martin
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
Strength of the electric field in apertureless near-field optical microscopy
- Yves C. Martin
- Hendrik F. Hamann
- et al.
- 2001
- Journal of Applied Physics
Optical data storage read out at 256 Gbits/in.2
- Y. Martin
- S. Rishton
- et al.
- 1997
- Applied Physics Letters
Scattering spectroscopy of molecules at nanometer resolution
- Y. Martin
- F. Zenhausern
- et al.
- 1996
- Applied Physics Letters
Scanning interferometric apertureless microscopy: Optical imaging at 10 angstrom resolution
- F. Zenhausern
- Y. Martin
- et al.
- 1995
- Science
Method for imaging sidewalls by atomic force microscopy
- Yves Martin
- H. Kumar Wickramasinghe
- 1994
- Applied Physics Letters
Magnetic force microscopy. A short review
- Y. Martin
- D.W. Abraham
- et al.
- 1989
- ECS Meeting 1989
High-resolution capacitance measurement and potentiometry by force microscopy
- Yves Martin
- David W. Abraham
- et al.
- 1988
- Applied Physics Letters
Atomic force microscope: Implementations
- P.C.D. Hobbs
- Y. Martin
- et al.
- 1989
- Proceedings of SPIE 1989