AC conductivity analysis as a measure of low k dielectric capacitor reliability degradation due to moisture ingress
- Cyril Cabral
- Robert B. Laibowitz
- et al.
- 2020
- Microelectronic Engineering
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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92 results for Franco Stellari
Superconducting single-photon detector enables time-resolved emission testing of low-voltage scaled ICS
- Andrea Bahgat Shehata
- Franco Stellari
- et al.
- 2016
- Electronic Device Failure Analysis
Self-Heating Measurement of 14-nm FinFET SOI Transistors Using 2-D Time-Resolved Emission
- Franco Stellari
- Keith A. Jenkins
- et al.
- 2016
- IEEE T-ED
Automated high-resolution imaging of very large fields of view (FOV)
- Franco Stellari
- Chung Ching Lin
- et al.
- 2015
- Electronic Device Failure Analysis
Single photon detectors for ultra low voltage time-resolved emission measurements
- Franco Stellari
- Peilin Song
- et al.
- 2011
- IEEE JQE
Characterization of random process variations using ultralow-power, high-sensitivity, bias-free sub-threshold process sensor
- Mesut Meterelliyoz
- Peilin Song
- et al.
- 2010
- IEEE TCAS-I
Operational amplifier based test structure for quantifying transistor threshold voltage variation
- Brian L. Ji
- Dale J. Pearson
- et al.
- 2009
- IEEE Trans Semicond Manuf
A packaging solution for optically testing wire-bonded chips
- Alberto Tosi
- Franco Stellari
- et al.
- 2008
- IEEE Transactions on Advanced Packaging
CMOS IC diagnostics using the light emission from off-state leakage currents (LEOSLC)
- Peilin Song
- Stas Polonsky
- et al.
- 2005
- Electronic Device Failure Analysis
Testing and diagnostics of CMOS circuits using light emission from off-state leakage current
- Franco Stellari
- Peilin Song
- et al.
- 2004
- IEEE Transactions on Electron Devices