Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- ISTFA 2003
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92 results for Franco Stellari
Hot-carrier luminescence: Comparison of different CMOS technologies
- Alberto Tosi
- Franco Stellari
- et al.
- 2003
- ESSDERC 2003
Latchup Analysis Using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- Microelectronics Reliability
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latch up
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
Backside flip-chip testing by means of high-bandwidth luminescence detection
- A. Tosi
- F. Stellari
- et al.
- 2003
- Microelectronics Reliability
Faster IC analysis with PICA spatial temporal photon correlation and CAD autochanneling
- R. Desplats
- A. Eral
- et al.
- 2003
- Microelectronics Reliability
Circuit voltage probe based on time-integrated measurements of optical emission from leakage current
- Franco Stellari
- Peilin Song
- et al.
- 2002
- ISTFA 2002
CMOS circuit analysis with luminescence measurements and simulations
- F. Stellari
- A. Tosi
- et al.
- 2002
- ESSDERC 2002
Optical diagnosis of excess IDDQ in low power CMOS circuits
- Franco Stellari
- Peilin Song
- et al.
- 2002
- Microelectronics Reliability