The impact of gate-oxide breakdown SRAM stability
- R. Rodríguez
- J.H. Stathis
- et al.
- 2002
- IEEE Electron Device Letters
Publications
216 results for Rajiv V. Joshi
Modeling 3D effects of substrate topography on step coverage and film morphology of thin metal films
- T. Smy
- S.K. Dew
- et al.
- 2002
- Thin Solid Films
Analysis of the effect of the gate oxide breakdown on SRAM stability
- R. Rodríguez
- J.H. Stathis
- et al.
- 2002
- Microelectronics Reliability
High performance SOI/Cu SRAMs and memories in microprocessors
- R.V. Joshi
- S.S. Kang
- et al.
- 2001
- AMC 2001
Novel circuits to improve SRAM performance in PD/SOI technology
- R.V. Joshi
- A.J. Bhavnagarwala
- et al.
- 2001
- IEEE International SOI Conference 2001
Mixed multi-threshold differential cascode voltage switch (MT-DCVS) circuit styles and strategies for low power VLSI design
- W. Chen
- W. Hwang
- et al.
- 2001
- ISLPED 2001
Effects of gate-to-body tunneling current on PD/SOI CMOS SRAM
- R.V. Joshi
- C.T. Chuang
- et al.
- 2001
- VLSI Technology 2001
SOI for asynchronous dynamic circuits
- R.V. Joshi
- W. Hwang
- et al.
- 2001
- GLSVLSI 2001
Design of provably correct storage arrays
- R.V. Joshi
- W. Hwang
- et al.
- 2001
- VLSID 2001
`Cool low power' 1 GHz multi-port register file and dynamic latch in 1.8 V, 0.25 μm SOI and bulk technology
- R.V. Joshi
- W. Hwang
- et al.
- 2000
- ISLPED 2000