Challenges for accurate reliability projections in the ultra-thin oxide regime
- E. Wu
- W.W. Abadeer
- et al.
- 1999
- IRPS 1999
Publications
Date
Featured collections
Popular topics
21 results for Shih Hsien Lo
Modeling and characterization of n+- and p+-polysilicon-gated ultra-thin oxides (21-26 angstroms)
- S.H. Lo
- D.A. Buchanan
- et al.
- 1997
- VLSI Technology 1997
Efficient AI System Design with Cross-Layer Approximate Computing
- Swagath Venkataramani
- Xiao Sun
- et al.
- 2020
- Proceedings of the IEEE
A Scalable Multi-TeraOPS Core for AI Training and Inference
- Sunil Shukla
- Bruce Fleischer
- et al.
- 2018
- IEEE SSC-L
On-off charge-voltage characteristics and dopant number fluctuation effects in junctionless double-gate MOSFETs
- Yuan Taur
- Han-Ping Chen
- et al.
- 2012
- IEEE T-ED
Estimation of gate-to-channel tunneling current in ultra-thin oxide sub-50 nm double gate devices
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2007
- Microelectronics Journal
Modeling and characterization of quantization, polysilicon depletion, and direct tunneling effects in MOSFETs with ultrathin oxides
- S.H. Lo
- D.A. Buchanan
- et al.
- 1999
- IBM J. Res. Dev
Atomic-scale studies of electron transport through MOS structures
- H.J. Wen
- R. Ludeke
- et al.
- 1998
- Applied Surface Science
Image force effects and the dielectric response of SiO2 in electron transport across metal-oxide-semiconductor structures
- H.J. Wen
- R. Ludeke
- et al.
- 1997
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Reliability and integration of ultra-thin gate dielectrics for advanced CMOS
- D.A. Buchanan
- S.H. Lo
- 1997
- Microelectronic Engineering