Challenges for accurate reliability projections in the ultra-thin oxide regime
- E. Wu
- W.W. Abadeer
- et al.
- 1999
- IRPS 1999
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
Date
Featured collections
Popular topics
21 results for Shih Hsien Lo
Modeling and characterization of n+- and p+-polysilicon-gated ultra-thin oxides (21-26 angstroms)
- S.H. Lo
- D.A. Buchanan
- et al.
- 1997
- VLSI Technology 1997
Efficient AI System Design with Cross-Layer Approximate Computing
- Swagath Venkataramani
- Xiao Sun
- et al.
- 2020
- Proceedings of the IEEE
A Scalable Multi-TeraOPS Core for AI Training and Inference
- Sunil Shukla
- Bruce Fleischer
- et al.
- 2018
- IEEE SSC-L
On-off charge-voltage characteristics and dopant number fluctuation effects in junctionless double-gate MOSFETs
- Yuan Taur
- Han-Ping Chen
- et al.
- 2012
- IEEE T-ED
Estimation of gate-to-channel tunneling current in ultra-thin oxide sub-50 nm double gate devices
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2007
- Microelectronics Journal
Modeling and characterization of quantization, polysilicon depletion, and direct tunneling effects in MOSFETs with ultrathin oxides
- S.H. Lo
- D.A. Buchanan
- et al.
- 1999
- IBM J. Res. Dev
Atomic-scale studies of electron transport through MOS structures
- H.J. Wen
- R. Ludeke
- et al.
- 1998
- Applied Surface Science
Image force effects and the dielectric response of SiO2 in electron transport across metal-oxide-semiconductor structures
- H.J. Wen
- R. Ludeke
- et al.
- 1997
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Reliability and integration of ultra-thin gate dielectrics for advanced CMOS
- D.A. Buchanan
- S.H. Lo
- 1997
- Microelectronic Engineering