An Analytical Metal Resistance Model and Its Application for Sub-22-nm Metal-Gate CMOS
- X. Miao
- Ruqiang Bao
- et al.
- 2015
- IEEE Electron Device Letters
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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193 results for Vijay Narayanan
Switching of ferroelectric polarization in epitaxial BaTiO 3 films on silicon without a conducting bottom electrode
- Catherine Dubourdieu
- John Bruley
- et al.
- 2013
- Nature Nanotechnology
Origins of effective work function roll-off behavior for high-κ last replacement metal gate stacks
- Takashi Ando
- Eduard A. Cartier
- et al.
- 2013
- IEEE Electron Device Letters
Maximized benefit of LaAlO higher-κ gate dielectrics by optimizing the La/Al atomic ratio
- Hiroaki Arimura
- Stephen L. Brown
- et al.
- 2011
- IEEE Electron Device Letters
High-κ/metal-gate fully depleted SOI CMOS with single-silicide schottky source/drain with sub-30-nm gate length
- Marwan H. Khater
- Zhen Zhang
- et al.
- 2010
- IEEE Electron Device Letters
Oxygen vacancies in high dielectric constant oxide-semiconductor films
- Supratik Guha
- Vijay Narayanan
- 2007
- Physical Review Letters
Process optimization for high electron mobility in nMOSFETs with aggressively scaled HfO2/metal stacks
- V. Narayanan
- K. Maitra
- et al.
- 2006
- IEEE Electron Device Letters
In-memory Realization of In-situ Few-shot Continual Learning with a Dynamically Evolving Explicit Memory
- G. Karunaratne
- M. Hersche
- et al.
- 2022
- ESSDERC/ESSCIRC 2022
A Flexible and Fast PyTorch Toolkit for Simulating Training and Inference on Analog Crossbar Arrays
- Malte J. Rasch
- Diego Moreda
- et al.
- 2021
- AICAS 2021
CMOS compatible high performance IIIV devices: Opportunities and challenges
- Yanning Sun
- Kuen-Ting Shiu
- et al.
- 2016
- ECS Meeting 2016