Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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55 results for Miaomiao Wang

Modeling of NBTI time kinetics and T dependence of VAF in SiGe p-FinFETs
- - Narendra Parihar
  - Richard G. Southwick
  - et al.
- 2017
- IEDM 2017
Hot carrier effect in ultra-scaled replacement metal gate Si_i-xGe_x channel p-FinFETs
- - Miaomiao Wang
  - X. Miao
  - et al.
- 2016
- IEDM 2016
Technology viable DC performance elements for Si/SiGe channel CMOS FinFTT
- - G. Tsutsui
  - Ruqiang Bao
  - et al.
- 2016
- IEDM 2016
Air spacer for 10nm FinFET CMOS and beyond
- - K. Cheng
  - C. Park
  - et al.
- 2016
- IEDM 2016
Reliability challenges for the 10nm node and beyond
- - James Stathis
  - Miaomiao Wang
  - et al.
- 2014
- IEDM 2014
Hardware Based Performance Assessment of Vertical-Transport Nanosheet Technology
- - Gen Tsutsui
  - Seunghyun Song
  - et al.
- 2022
- IEDM 2022
Superior PBTI reliability for SOI FinFET technologies and its physical understanding
- - Miaomiao Wang
  - Ramachandran Muralidhar
  - et al.
- 2013
- IEEE Electron Device Letters
Impact of Gate Stack Thermal Budget on NBTI Reliability in Gate-All-Around Nanosheet P-type Devices
- - Huimei Zhou
  - Miaomiao Wang
  - et al.
- 2023
- IRPS 2023
A Flexible and Inherently Self-Consistent Methodology for MOL/BEOL/MIMCAP TDDB Applications with Excessive Variability-Induced Degradation
- - Ernest Wu
  - Ron Bolam
  - et al.
- 2022
- IRPS 2022
SiGe Gate-All-around Nanosheet Reliability
- - Huimei Zhou
  - Miaomiao Wang
  - et al.
- 2022
- IRPS 2022