Publications

198 results for Christian Lavoie

In situ x-ray diffraction study of graphitic carbon formed during heating and cooling of amorphous-C/Ni bilayers
- - Katherine Saenger
  - James C. Tsang
  - et al.
- 2010
- Applied Physics Letters
High-κ/metal-gate fully depleted SOI CMOS with single-silicide schottky source/drain with sub-30-nm gate length
- - Marwan H. Khater
  - Zhen Zhang
  - et al.
- 2010
- IEEE Electron Device Letters
Texture of cobalt germanides on Ge(100) and Ge(111) and its influence on the formation temperature
- - K. De Keyser
  - R.L. Van Meirhaeghe
  - et al.
- 2010
- JES
In situ X-ray diffraction study of thin film Ir/Si solid state reactions
- - W. Knaepen
  - J. Demeulemeester
  - et al.
- 2010
- Microelectronic Engineering
In situ study of the formation of silicide phases in amorphous Co-Si mixed layers
- - C. Van Bockstael
  - K. De Keyser
  - et al.
- 2010
- Microelectronic Engineering
Morphological stability and specific resistivity of sub-10 nm silicide films of _{Ni1-x Ptx} on Si substrate
- - Zhen Zhang
  - Shi Li Zhang
  - et al.
- 2010
- Applied Physics Letters
Trigate 6T SRAM scaling to 0.06 μm²
- - M. Guillorn
  - J. Chang
  - et al.
- 2009
- IEDM 2009
In situ x-ray diffraction study of Ni-Yb interlayer and alloy systems on Si(100)
- - W. Knaepen
  - J. Demeulemeester
  - et al.
- 2009
- JVSTA
Copper contact metallization using Ru-based barrier liners for 45 nm and 32 nm nodes: Reliability and device performance
- - Soon-Cheon Seo
  - Chih-Chao Yang
  - et al.
- 2008
- ADMETA 2008
Stress determination in nickel monosilicide films using x-ray diffraction
- - Conal E. Murray
  - Zhen Zhang
  - et al.
- 2009
- Journal of Applied Physics