Photon emission microscopy of inter/intra chip device performance variations
- S. Polonsky
- M. Bhushan
- et al.
- 2005
- ESREF 2005
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61 results for Alan J. Weger
CMOS IC diagnostics using the light emission from off-state leakage currents (LEOSLC)
- Peilin Song
- Stas Polonsky
- et al.
- 2005
- Electronic Device Failure Analysis
Broken scan chain diagnostics based on time-integrated and time-dependent emission measurements
- Franco Stellari
- Peilln Song
- et al.
- 2004
- ISTFA 2004
Dynamic latchup study using transmission line pulses and picosecond imaging circuit analysis
- Franco Stellari
- Alan J. Weger
- et al.
- 2004
- ESSDERC/ESSCIRC 2004
CMOS IC diagnostics using the luminescence of OFF-state leakage currents
- Stas Polonsky
- Keith A. Jenkins
- et al.
- 2004
- IEEE ITC 2004
A novel scan chain diagnostics technique based on light emission from leakage current
- Peilin Song
- Franco Stellari
- et al.
- 2004
- IEEE ITC 2004
Off-state luminescence in metal-oxide-semiconductor field-effect transistors and Its use as on-chip voltage probe
- Stas Polonsky
- Alan Weger
- 2004
- Applied Physics Letters
I/O interface latchup analysis using optical and electrical testing
- Franco Stellari
- Peilin Song
- et al.
- 2004
- Electronic Device Failure Analysis
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- K. Chatty
- P.E. Cottrell
- et al.
- 2004
- IRPS 2004
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- K. Chatty
- P.E. Cottrell
- et al.
- 2004
- IRPS 2004