Dynamic latchup study using transmission line pulses and picosecond imaging circuit analysis
- Franco Stellari
- Alan J. Weger
- et al.
- 2004
- ESSDERC/ESSCIRC 2004
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61 results for Alan J. Weger
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- K. Chatty
- P.E. Cottrell
- et al.
- 2004
- IRPS 2004
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- K. Chatty
- P.E. Cottrell
- et al.
- 2004
- IRPS 2004
Optical and Electrical Testing of Latchup in I/O Interface Circuits
- Franco Stellari
- Peilin Song
- et al.
- 2003
- IEEE ITC 2003
Time-Resolved Optical Measurements from 0.13μm CMOS Technology Microprocessor using a Superconducting Single-Photon Detector
- Franco Stellari
- Peilin Song
- et al.
- 2003
- ISTFA 2003
Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- ISTFA 2003
Latchup Analysis Using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- Microelectronics Reliability
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latch up
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
Faster IC analysis with PICA spatial temporal photon correlation and CAD autochanneling
- R. Desplats
- A. Eral
- et al.
- 2003
- Microelectronics Reliability