SiGe-Channel Heterojunction p-MOSFET’s
- Sophie Verdonckt-Vandebroek
- Bernard S. Meyerson
- et al.
- 1994
- IEEE Transactions on Electron Devices
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66 results for Phillip Restle
Internal probing of submicron FETs and photoemission using individual oxide traps
- P. Restle
- Antonio Gnudi
- 1990
- IBM J. Res. Dev
Novel self-aligned W/TiN/TiSi2 contact structure for very shallow junctions and interconnections
- R.V. Joshi
- D. Moy
- et al.
- 1989
- Applied Physics Letters
A 3.5-ns/77 K and 6.2-ns/300 K 64K CMOS RAM with ECL Interfaces
- Terry I. Chappell
- Stanley E. Schuster
- et al.
- 1989
- IEEE Journal of Solid-State Circuits
Individual oxide traps as probes into submicron devices
- Phillip Restle
- 1988
- Applied Physics Letters
Fast CMOS ECL Receivers with 100-mV Worst-Case Sensitivity
- Barbara A. Chappell
- Terry I. Chappell
- et al.
- 1988
- IEEE Journal of Solid-State Circuits