Experiment and model for deviation from Pelgrom scaling relation in device width
- Ning Lu
- J. Brown
- et al.
- 2014
- IEDM 2014
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7 results for J. Brown
Trimming of hard-masks by gaseous chemical oxide removal (COR) for sub-10nm gates/fins, for gate length control and for embedded logic
- Wesley C. Natzle
- David Horak
- et al.
- 2004
- ASMC 2004
Enhanced multi-threshold (MTCMOS) circuits using variable well bias
- S.V. Kosonocky
- M.J. Immediato
- et al.
- 2001
- ISLPED 2001
Low-power CMOS at Vdd=4kT/q
- A. Bryant
- J. Brown
- et al.
- 2001
- DRC 2001
Latchup in CMOS technology
- M. Hargrove
- S. Voldman
- et al.
- 1998
- IRPS 1998
Effect of hot carrier stress on device junctions measured by electron holography and scanning capacitance microscopy
- Yun-Yu Wang
- J. Nxumalo
- et al.
- 2018
- Applied Physics Letters
Transistor mismatch properties in deep-submicrometer CMOS technologies
- Xiaobin Yuan
- Takashi Shimizu
- et al.
- 2011
- IEEE T-ED