Sources of variability in alpha emissivity measurements at la and ULA levels, a multicenter study
- Brendan D. McNally
- Stuart Coleman
- et al.
- 2014
- Nucl. Instrum. Methods Phys. Res
Publications
Date
Featured collections
Popular topics
48 results for Michael S. Gordon
Titration of submonolayer Au growth on Si(111)
- Jaap Kautz
- M. Copel
- et al.
- 2014
- Physical Review B - CMMP
Giant piezoresistive On/Off ratios in rare-earth chalcogenide thin films enabling nanomechanical switching
- Matthew Copel
- Marcelo A. Kuroda
- et al.
- 2013
- Nano Letters
Selected topics in ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2013
- IEEE TNS
Ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2012
- IEEE TNS
Past, present, and future of backscatter electron (BSE) imaging
- Oliver C. Wells
- Michael S. Gordon
- et al.
- 2012
- ScMi 2012
Physical characterization of sub-32-nm semiconductor materials and processes using advanced ion beam-based analytical techniques
- M. Hopstaken
- D. Pfeiffer
- et al.
- 2012
- Surface and Interface Analysis
32 and 45 nm radiation-hardened-by-design (RHBD) SOI latches
- Kenneth P. Rodbell
- David F. Heidel
- et al.
- 2011
- IEEE TNS
FDSOI radiation dosimeters
- Jeng-Bang Yau
- Michael S. Gordon
- et al.
- 2011
- VLSI-TSA 2011
Multicenter comparison of alpha particle measurements and methods typical of semiconductor processing
- Jeffrey D. Wilkinson
- Brett M. Clark
- et al.
- 2011
- IRPS 2011