Low Energy Proton SEUs in 32-nm SOI SRAMs at Low Vdd
- Ken Rodbell
- Michael S. Gordon
- et al.
- 2017
- IEEE TNS
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48 results for Michael S. Gordon
The Role of Sample Geometry on Ultra-Low Alpha Particle Emissivity Measurements
- Michael S. Gordon
- Ken Rodbell
- et al.
- 2017
- IEEE TNS
Measurements of radioactive contaminants in semiconductor materials
- Michael S. Gordon
- Ken Rodbell
- et al.
- 2016
- Semiconductor Science and Technology
Energy Dependent Efficiency in Low Background Alpha Measurements and Impacts on Accurate Alpha Characterization
- Hiroyoshi Kawasaki
- Brett M. Clark
- et al.
- 2015
- IEEE TNS
The Role of Static Charge in Ultra-Low Alpha Particle Emissivity Measurements
- Michael. S. Gordon
- Kenneth P. Rodbell
- et al.
- 2015
- IEEE TNS
New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle
- N.A. Dodds
- P.E. Dodd
- et al.
- 2015
- IEEE TNS
SOI FinFET soft error upset susceptibility and analysis
- Phil Oldiges
- Ken Rodbell
- et al.
- 2015
- IRPS 2015
Pathway to the Piezoelectronic Transduction Logic Device
- Paul Solomon
- Brian A. Bryce
- et al.
- 2015
- Nano Letters
Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam
- Nathaniel A. Dodds
- James R. Schwank
- et al.
- 2014
- IEEE TNS
Criticality of low-energy protons in single-event effects testing of highly-scaled technologies
- Jonathan A. Pellish
- Paul W. Marshall
- et al.
- 2014
- IEEE TNS