Technologies to further reduce soft error susceptibility in SOI
- P. Oldiges
- R.H. Dennard
- et al.
- 2009
- IEDM 2009
Publications
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48 results for Michael S. Gordon
SOI FinFET soft error upset susceptibility and analysis
- Phil Oldiges
- Ken Rodbell
- et al.
- 2015
- IRPS 2015
Past, present, and future of backscatter electron (BSE) imaging
- Oliver C. Wells
- Michael S. Gordon
- et al.
- 2012
- ScMi 2012
FDSOI radiation dosimeters
- Jeng-Bang Yau
- Michael S. Gordon
- et al.
- 2011
- VLSI-TSA 2011
Multicenter comparison of alpha particle measurements and methods typical of semiconductor processing
- Jeffrey D. Wilkinson
- Brett M. Clark
- et al.
- 2011
- IRPS 2011
Stacked devices for SEU immune design
- Phil Oldiges
- Kenneth P. Rodbell
- et al.
- 2010
- IEEE International SOI Conference 2010
Sputtering behavior and evolution of depth resolution upon low energy ion irradiation of GaAs
- Marinus Hopstaken
- Dirk Pfeiffer
- et al.
- 2010
- ECS Transactions
Multi-bit upsets in 65nm SOI SRAMs
- Ethan H. Cannon
- Michael S. Gordon
- et al.
- 2008
- IRPS 2008
Development of a novel ion time-of-flight spectrometer for neutron depth profiling
- Sacit M. Cetiner
- Rudolph Tromp
- et al.
- 2008
- ANS Annual Conference 2008
Protecting big blue from rogue subatomic particles
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2007
- ICICDT 2007