Conference paper
SOI FinFET soft error upset susceptibility and analysis
Phil Oldiges, Ken Rodbell, et al.
IRPS 2015
New alpha counters make accurate measurements of low emissivity samples possible. Modeling results set lower limits for measurements at sea level of silicon substrates to about 0.3α khr-cm2. Our measurements demonstrate the effect of cosmic ray shielding on the measured alpha-particle emissivity. A few atoms of radon contamination can cause elevated emissivities many days after exposure. © 1963-2012 IEEE.
Phil Oldiges, Ken Rodbell, et al.
IRPS 2015
Michael S. Gordon, Kenneth P. Rodbell, et al.
IEEE TNS
Michael S. Gordon, Kenneth P. Rodbell, et al.
IBM J. Res. Dev
Henry H. K. Tang, Conal E. Murray, et al.
IEEE TNS