Ring oscillator based test structure for NBTI analysis
- Mark B. Ketchen
- Manjul Bhushan
- et al.
- 2007
- ICMTS 2007
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16 results for Ronald Bolam
Evaluation of device damage from e-beam curing of ultra low-k BEOL dielectrics
- S. Mehta
- C. Dimitrakopoulos
- et al.
- 2005
- AMC 2005
Interface state generation in pFETs with ultra-thin oxide and oxynitride on (100) and (110) Si substrates
- J.H. Stathis
- R. Bolam
- et al.
- 2005
- INFOS 2005
0.22 μm CMOS-SOI technology with a Cu BEOL
- A. Ajmera
- J. Sleight
- et al.
- 1999
- VLSI Technology 1999
Device and circuit design issues in SOI technology
- G. Shahidi
- A. Ajmera
- et al.
- 1999
- CICC 1999
Applications of clustering model to bimodal distributions for dielectric breakdown
- Ernest Y. Wu
- Ronald Bolam
- et al.
- 2017
- JVSTB