Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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45 results for Richard G. Southwick

Fundamental roles of extreme-value distributions in dielectric breakdown and memory applications (minimum-value versus maximum-value statistics)
- - Ernest Wu
  - Takashi Ando
  - et al.
- 2020
- Japanese Journal of Applied Physics
Modeling of NBTI kinetics in replacement metal gate Si and SiGe FinFETs - Part-II: AC stress and recovery
- - Narendra Parihar
  - Richard G. Southwick
  - et al.
- 2018
- IEEE T-ED
Modeling of NBTI kinetics in RMG Si and SiGe FinFETs, Part-I: DC stress and recovery
- - Narendra Parihar
  - Richard G. Southwick
  - et al.
- 2018
- IEEE T-ED
Ultrafast measurements and physical modeling of NBTI stress and recovery in RMG FinFETs under diverse DC-AC experimental conditions
- - Narendra Parihar
  - Uma Sharma
  - et al.
- 2018
- IEEE T-ED
Frequency-modulated charge pumping with extremely high gate leakage
- - Jason T. Ryan
  - Jibin Zou
  - et al.
- 2015
- IEEE T-ED