PaperImpact of hot-carrier degradation on drain-induced barrier lowering in multifin SOI n-Channel FinFETs with self-heating
PaperReliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-Heating
Conference paperImpact of Line and Via Resistance on Device Performance at the 5nm Gate All Around Node and beyond
