Virtual de-embedding study for the accurate extraction of Fin FET gate resistance
- Shireen Warnock
- Rob Groves
- et al.
- 2014
- CICC 2014
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
Date
Featured collections
Popular topics
32 results for Richard A. Wachnik
Gate stack resistance and limits to CMOS logic performance
- Richard A. Wachnik
- S. Lee
- et al.
- 2013
- CICC 2013
Experimental analysis and modeling of self heating effect in dielectric isolated planar and fin devices
- S. Lee
- Richard A. Wachnik
- et al.
- 2013
- VLSI Technology 2013
An efficient and accurate schematic transistor model of FinFET parasitic elements
- Ning Lu
- Terence B. Hook
- et al.
- 2013
- NSTI-Nanotech 2013
A fully automated method to create Monte-Carlo MOSFET model libraries for statistical circuit simulations
- Jing Wang
- Henry Trombley
- et al.
- 2012
- NSTI-Nanotech 2012
RF modeling of 45nm low-power CMOS technology
- Jing Wang
- Hongmei Li
- et al.
- 2009
- NSTI-Nanotech 2009
Progress in SiGe technology toward fully integrated mmwave ICs
- B.P. Gaucher
- S.K. Reynolds
- et al.
- 2006
- ISTDM 2006
Thermal cycle reliability of stacked via structures with copper metallization and an organic low-k dielectric
- R. Filippi
- J.F. McGrath
- et al.
- 2004
- IRPS 2004
Thermal cycle reliability of stacked via structures with copper metallization and an organic low-k dielectric
- R. Filippi
- J.F. McGrath
- et al.
- 2004
- IRPS 2004
Breakdown measurements of ultra-thin SiO2 at low voltage
- J.H. Stathis
- A. Vayshenker
- et al.
- 2000
- VLSI Technology 2000