CDSEM AFM hybrid metrology for the characterization of gate-all-around silicon nano wires
- Shimon Levi
- Ishai Schwarzband
- et al.
- 2014
- SPIE Advanced Lithography 2014
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144 results for Lynne Gignac
200 mm wafer-scale integration of sub-20 nm sacrificial nanofluidic channels for manipulating and imaging single DNA molecules
- C. Wang
- S.W. Nam
- et al.
- 2013
- IEDM 2013
Density scaling with gate-all-around silicon nanowire MOSFETs for the 10 nm node and beyond
- Sarunya Bangsaruntip
- K. Balakrishnan
- et al.
- 2013
- IEDM 2013
Automatic registering and stitching of TEM/STEM image mosaics
- Chung-Ching Lin
- Franco Stellari
- et al.
- 2013
- ISTFA 2013
Buckling characterization of gate all around silicon nanowires
- Shimon Levi
- Ishai Schwarzband
- et al.
- 2013
- SPIE Advanced Lithography 2013
Pattern transfer of directed self-assembly (DSA) patterns for CMOS device applications
- Hsin-Yu Tsai
- Hiroyuki Miyazoe
- et al.
- 2013
- SPIE Advanced Lithography 2013
Carbon nanotube complementary wrap-gate transistors
- Aaron D. Franklin
- Siyuranga O. Koswatta
- et al.
- 2013
- Nano Letters
Selective area growth of III-V nanowires and their heterostructures on silicon in a nanotube template: Towards monolithic integration of nano-devices
- Pratyush Das Kanungo
- Heinz Schmid
- et al.
- 2013
- Nanotechnology
Materials and scaling effects on on-chip interconnect reliability
- C.-K. Hu
- E. Liniger
- et al.
- 2013
- MRS Spring Meeting 2013
Stacking graphene channels in parallel for enhanced performance with the same footprint
- Aaron D. Franklin
- Satoshi Oida
- et al.
- 2013
- IEEE Electron Device Letters