Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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35 results for Robert Gauthier

Design and characterization of a multi-rc-triggered MOSFET-based power clamp for on-chip ESD protection
- - Junjun Li
  - Robert Gauthier
  - et al.
- 2006
- EOS/ESD 2006
Study of design factors affecting turn-on time of silicon controlled rectifiers (SCRs) in 90 and 65NM bulk CMOS technologies
- - James Di Sarro
  - Kiran Chatty
  - et al.
- 2006
- IRPS 2006
Analysis of failure mechanism on gate-silicided and gate-non-silicided, drain/source silicide-blocked ESD NMOSFETs in a 65nm bulk CMOS technology
- - Junjun Li
  - David Alvarez
  - et al.
- 2006
- IPFA 2006
PMOSFET-based ESD protection in 65nm bulk CMOS technology for improved external latchup robustness
- - Junjun Li
  - Robert Gauthier
  - et al.
- 2005
- EOS/ESD 2005
VF-TLP systems using TDT and TDRT for Kelvin wafer measurements and package level testing
- - Evan Grund
  - Robert Gauthier
- 2004
- EOS/ESD 2004
A compact, timed-shutoff, MOSFET-based power clamp for on-chip ESD protection
- - Junjun Li
  - Robert Gauthier
  - et al.
- 2004
- EOS/ESD 2004
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- - K. Chatty
  - P.E. Cottrell
  - et al.
- 2004
- IRPS 2004
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- - K. Chatty
  - P.E. Cottrell
  - et al.
- 2004
- IRPS 2004
Optical and Electrical Testing of Latchup in I/O Interface Circuits
- - Franco Stellari
  - Peilin Song
  - et al.
- 2003
- IEEE ITC 2003
Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy
- - Franco Stellari
  - Peilin Song
  - et al.
- 2003
- ISTFA 2003