Publications

232 results for Jerry Tersoff

Stress-driven segregation at a Si-Ge alloy surface
- - J. Tersoff
  - P.C. Kelires
- 1990
- Symposium on Process Physics and Modeling in Semiconductor Technology 1990
Surface-stress-induced order in SiGe alloy films
- - F. Legoues
  - V.P. Kesan
  - et al.
- 1990
- Physical Review Letters
Carbon defects and defect reactions in silicon
- - J. Tersoff
- 1990
- Physical Review Letters
Role of tip electronic structure in scanning tunneling microscope images
- - J. Tersoff
- 1990
- Physical Review B
Method for the calculation of scanning tunneling microscope images and spectra
- - J. Tersoff
- 1989
- Physical Review B
Evidence for a large valence-band offset at HgTe-CdTe heterojunctions
- - J. Tersoff
- 1989
- Physical Review B
Semiconductor surface characterization with scanning tunneling microscopy
- - J. Tersoff
- 1989
- ESSDERC Satellite Symposium 1989
Equilibrium alloy properties by direct simulation: Oscillatory segregation at the Si-Ge(100) 2×1 surface
- - P.C. Kelires
  - J. Tersoff
- 1989
- Physical Review Letters
Modeling solid-state chemistry: Interatomic potentials for multicomponent systems
- - J. Tersoff
- 1989
- Physical Review B
Sample-dependent resolution in scanning tunneling microscopy
- - J. Tersoff
- 1989
- Physical Review B