Empirical interatomic potential for silicon with improved elastic properties
- 1988
- Physical Review B
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232 results for Jerry Tersoff
New empirical approach for the structure and energy of covalent systems
- 1988
- Physical Review B
Some properties of ReSi2
- C. Krontiras
- L. Grönberg
- et al.
- 1988
- Thin Solid Films
Chemically induced grain boundary migration in doped polycrystalline silicon films
- K.N. Tu
- J. Tersoff
- et al.
- 1988
- Solid State Communications
Summary Abstract: Structure analysis of the GaAs(110) surface by scanning tunneling microscopy
- J. Tersoff
- R.M. Feenstra
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Scanning tunneling microscopy
- Paul K. Hansma
- Jerry Tersoff
- 1987
- Journal of Applied Physics
Resistivity of the solid solutions (Co-Ni)Si2
- F.M. D'Heurle
- J. Tersoff
- et al.
- 1986
- Journal of Applied Physics
Tunneling microscopy study of the graphite surface in air and water
- J. Schneir
- R. Sonnenfeld
- et al.
- 1986
- Physical Review B
Calculation of Schottky barrier heights from semiconductor band structures
- 1986
- Surface Science
The formation of disilicides from bilayers of Ni/Co and Co/Ni on silicon: Phase separation and solid solution
- T.G. Finstad
- D.D. Anfiteatro
- et al.
- 1986
- Thin Solid Films