S.-L. Zhang, J.M.E. Harper, et al.
Journal of Electronic Materials
Solid solutions of CoSi2 and NiSi2 were prepared from the solid-state reaction of thin films of Ni-Co alloys with their silicon substrates. The room-temperature resistivity of these silicide solid solutions does not increase parabolically, but (within the sensitivity of the measurements) varies linearly with composition. A model is proposed which explains the very weak alloy scattering on the basis that in these disilicides (a) the d bands are pushed below the Fermi level, (b) conduction occurs mostly via s electrons, and (c) there is no s-d scattering.
S.-L. Zhang, J.M.E. Harper, et al.
Journal of Electronic Materials
F. Jahnel, J.P. Biersack, et al.
Journal of Applied Physics
P. Gas, C. Bergman, et al.
Applied Physics Letters
J. Tersoff, D.E. Jesson, et al.
Science