New methodology for early-stage, microarchitecture-level power-performance analysis of microprocessors
- David Brooks
- Pradip Bose
- et al.
- 2003
- IBM J. Res. Dev
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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19 results for Michael Rosenfield
Performance analysis of tapered gate in PD/SOI CMOS technology
- W. Hwang
- C.T. Chuang
- et al.
- 2002
- International Journal of Electronics
On the temperature dependence of hysteresis effect in floating-body partially depleted SOI CMOS circuits
- R. Puri
- C.T. Chuang
- et al.
- 2001
- IEEE Journal of Solid-State Circuits
Improved underlayers for acid amplified resists
- H.S. Sachdev
- R.W. Kwong
- et al.
- 1994
- Microelectronic Engineering
Overlay measurement using the low voltage scanning electron microscope
- Michael G. Rosenfield
- A. Starikov
- 1992
- Microelectronic Engineering
A study of proximity effects at high electron-beam voltages for x-ray mask fabrication part 1: Additive mask processes
- Michael G. Rosenfield
- S. Rishton
- et al.
- 1991
- Microelectronic Engineering
Determination of proximity effect correction parameters for 0.1 μm electron-beam lithography
- Michael G. Rosenfield
- S.J. Wind
- et al.
- 1990
- Microelectronic Engineering
ANALYSIS OF BACKSCATTERED ELECTRON SIGNALS FOR X-RAY MASK INSPECTION.
- Michael G. Rosenfield
- 1985
- Scanning Electron Microscopy
COMPARISON OF BACKSCATTERED ELECTRON AND OPTICAL IMAGES FOR SUBMICRON DEFECT DETECTION.
- Michael G. Rosenfield
- Douglas S. Goodman
- et al.
- 1984
- Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena