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- Venkat Balagurusamy
- Cyril Cabral
- et al.
- 2019
- IBM J. Res. Dev
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162 results for Cyril Cabral
Prediction of recrystallization times in electroplated copper thin films
- Mikhail Treger
- C. Witt
- et al.
- 2016
- Thin Solid Films
Enhanced grain growth of electroplated copper on cobalt-containing seed layer
- Q. Huang
- B.C. Baker-O'Neal
- et al.
- 2013
- JES
Characterization of room temperature recrystallization kinetics in electroplated copper thin films with concurrent x-ray diffraction and electrical resistivity measurements
- Mikhail Treger
- Christian Witt
- et al.
- 2013
- Journal of Applied Physics
Irreversible altering of crystalline phase of phase-change Ge-Sb thin films
- Lia Krusin-Elbaum
- D. Shakhvorostov
- et al.
- 2010
- Applied Physics Letters
Phase transitions in Ge-Sb phase change materials
- Simone Raoux
- Cyril Cabral
- et al.
- 2009
- Journal of Applied Physics
Thermal stress effects of Ge2Sb2Te5 phase change material: Irreversible modification with Ti adhesion layers and segregation of Te
- K.N. Chen
- C. Cabral Jr.
- et al.
- 2008
- Microelectronic Engineering
Direct evidence for abrupt postcrystallization germanium precipitation in thin phase-change films of Sb-15 at. % Ge
- C. Cabral
- L. Krusin-Elbaum
- et al.
- 2008
- Applied Physics Letters
Alpha-particle-induced upsets in advanced CMOS circuits and technology
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev
Single-event-upset and alpha-particle emission rate measurement techniques
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev