Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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182 results for Eduard Cartier

Voltage ramp stress based stress-and-sense test method for reliability characterization of Hf-base high-k/metal gate stacks for CMOS technologies
- - E. Cartier
  - Andreas Kerber
  - et al.
- 2011
- ECS Meeting 2011
Full metal gate with borderless contact for 14 nm and beyond
- - Soon-Cheon Seo
  - L.F. Edge
  - et al.
- 2011
- VLSI Technology 2011
Fast characterization of the Static Noise Margin degradation of cross-coupled inverters and correlation to BTI instabilities in MG/HK devices
- - Andreas Kerber
  - N. Pimparkar
  - et al.
- 2011
- IRPS 2011
PBTI under dynamic stress: From a single defect point of view
- - K. Zhao
  - J.H. Stathis
  - et al.
- 2011
- IRPS 2011
Analysis of recoverable and non-recoverable NBTI and PBTI using AC and DC stresses
- - Frederic Monsieur
  - Eduard Cartier
  - et al.
- 2011
- IRPS 2011
A robust reliability methodology for accurately predicting Bias Temperature Instability induced circuit performance degradation in HKMG CMOS
- - D.P. Ioannou
  - K. Zhao
  - et al.
- 2011
- IRPS 2011
PBTI relaxation dynamics after ac VS. DC stress in high-K/metal gate stacks
- - K. Zhao
  - J.H. Stathis
  - et al.
- 2010
- IRPS 2010
Impact of charge trapping on the voltage acceleration of TDDB in metal gate/high-k n-channel MOSFETs
- - A. Kerber
  - A. Vayshenker
  - et al.
- 2010
- IRPS 2010
PBTI response to interfacial layer thickness variation in Hf-based HKMG nFETs
- - D.P. Ioannou
  - E. Cartier
  - et al.
- 2010
- IRPS 2010
Gate-all-around silicon nanowire 25-stage CMOS ring oscillators with diameter down to 3 nm
- - Sarunya Bangsaruntip
  - A. Majumdar
  - et al.
- 2010
- VLSI Technology 2010