Fernando Marianno, Wang Zhou, et al.
INFORMS 2021
Photocurrent spectroscopy and transient photocurrent measurements are employed in order to investigate the change in barrier heights and density of traps within low-k dielectric films under bias stressing conditions. By characterizing these fundamental physical properties, we hope to gain an understanding of the processes leading to time-dependent dielectric breakdown. © 2009 Elsevier B.V. All rights reserved.
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
Gregory Czap, Kyungju Noh, et al.
APS Global Physics Summit 2025
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001