Hardness assurance testing for proton direct ionization effects
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2011
- RADECS 2011
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15 results for James R. Schwank
Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2009
- RADECS 2009
Heavy ion testing at the galactic cosmic ray energy peak
- Jonathan A. Pellish
- Michael A. Xapsos
- et al.
- 2009
- RADECS 2009
Radiation-Induced Charge Trapping in Thin Al2O 3/SiOxNy/Si(100) Gate Dielectric Stacks
- J.A. Felix
- M.R. Shaneyfelt
- et al.
- 2003
- IEEE TNS
Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam
- Nathaniel A. Dodds
- James R. Schwank
- et al.
- 2014
- IEEE TNS
Criticality of low-energy protons in single-event effects testing of highly-scaled technologies
- Jonathan A. Pellish
- Paul W. Marshall
- et al.
- 2014
- IEEE TNS
Hardness assurance testing for proton direct ionization effects
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2012
- IEEE TNS
32 and 45 nm radiation-hardened-by-design (RHBD) SOI latches
- Kenneth P. Rodbell
- David F. Heidel
- et al.
- 2011
- IEEE TNS
Comparison of single and two-photon absorption for laser characterization of single-event upsets in SOI SRAMs
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2011
- IEEE TNS
Heavy ion testing with iron at 1 GeV/amu
- Jonathan A. Pellish
- Michael A. Xapsos
- et al.
- 2010
- IEEE TNS