James R. Schwank, Marty R. Shaneyfelt, et al.
IEEE TNS
We report low-energy proton and low-energy alpha particle SEE data on a 32 nm SOI CMOS SRAM that demonstrates the criticality of using low-energy protons for SEE testing of highly-scaled technologies. Low-energy protons produced a significantly higher fraction of multi-bit upsets relative to single-bit upsets when compared to similar alpha particle data. This difference highlights the importance of performing hardness assurance testing with protons that include energy distribution components below 2 MeV. The importance of low-energy protons to system-level single-event performance is based on the technology under investigation as well as the target radiation environment.
James R. Schwank, Marty R. Shaneyfelt, et al.
IEEE TNS
Jeff Gambino, Timothy D. Sullivan, et al.
MRS Spring Meeting 2007
James R. Schwank, Marty R. Shaneyfelt, et al.
RADECS 2011
R.T. Gordon, Conal E. Murray, et al.
Applied Physics Letters