Impact of spacecraft shielding on direct ionization soft error rates for sub-130 nm technologies
- Jonathan A. Pellish
- Michael A. Xapsos
- et al.
- 2010
- IEEE TNS
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16 results for Jonathan A. Pellish
Heavy ion testing with iron at 1 GeV/amu
- Jonathan A. Pellish
- Michael A. Xapsos
- et al.
- 2010
- IEEE TNS
Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2010
- IEEE TNS
Heavy ion microbeam-and broadbeam-induced transients in SiGe HBTs
- Jonathan A. Pellish
- Robert A. Reed
- et al.
- 2009
- IEEE TNS
Single-event upsets and multiple-bit upsets on a 45 nm SOI SRAM
- David F. Heidel
- Paul W. Marshall
- et al.
- 2009
- IEEE TNS
Design implications of single event transients in a commercial 45 nm SOI device technology
- Aj Kleinosowski
- Ethan H. Cannon
- et al.
- 2008
- IEEE TNS