Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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16 results for Jonathan A. Pellish

Impact of spacecraft shielding on direct ionization soft error rates for sub-130 nm technologies
- - Jonathan A. Pellish
  - Michael A. Xapsos
  - et al.
- 2010
- IEEE TNS
Heavy ion testing with iron at 1 GeV/amu
- - Jonathan A. Pellish
  - Michael A. Xapsos
  - et al.
- 2010
- IEEE TNS
Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
- - James R. Schwank
  - Marty R. Shaneyfelt
  - et al.
- 2010
- IEEE TNS
Heavy ion microbeam-and broadbeam-induced transients in SiGe HBTs
- - Jonathan A. Pellish
  - Robert A. Reed
  - et al.
- 2009
- IEEE TNS
Single-event upsets and multiple-bit upsets on a 45 nm SOI SRAM
- - David F. Heidel
  - Paul W. Marshall
  - et al.
- 2009
- IEEE TNS
Design implications of single event transients in a commercial 45 nm SOI device technology
- - Aj Kleinosowski
  - Ethan H. Cannon
  - et al.
- 2008
- IEEE TNS