A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM
- S.M. Schramm
- A.B. Pang
- et al.
- 2012
- Ultramicroscopy
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228 results for Rudolf M. Tromp
Atomic-scale transport in epitaxial graphene
- Shuai-Hua Ji
- James B. Hannon
- et al.
- 2011
- Nature Materials
Direct measurement of the growth mode of graphene on SiC(0001) and SiC(0001̄)
- James B. Hannon
- Matthew Copel
- et al.
- 2011
- Physical Review Letters
Low-energy electron microscopy and spectroscopy with ESCHER: Status and prospects
- S.M. Schramm
- J. Kautz
- et al.
- 2011
- IBM J. Res. Dev
Highly uniform step and terrace structures on SiC(0001) surfaces
- J. Sun
- J.B. Hannon
- et al.
- 2011
- IBM J. Res. Dev
A simple in situ method to detect graphene formation at SiC surfaces
- Satoshi Oida
- James B. Hannon
- et al.
- 2011
- Applied Physics Letters
Low energy electron microscopy imaging using Medipix2 detector
- I. Sikharulidze
- R. Van Gastel
- et al.
- 2011
- Nucl. Instrum. Methods Phys. Res
Medium energy ion scattering of Gr on SiC(0001) and Si(100)
- Matthew Copel
- Satoshi Oida
- et al.
- 2011
- Applied Physics Letters
Measuring and correcting aberrations of a cathode objective lens
- Rudolf M. Tromp
- 2011
- Ultramicroscopy
Large-area graphene single crystals grown by low-pressure chemical vapor deposition of methane on copper
- Xuesong Li
- Carl W. Magnuson
- et al.
- 2011
- JACS