Transconductance Degradation in Thin-Oxide MOSFET's
- Giorgio Baccarani
- Matthew R. Wordeman
- 1983
- IEEE T-ED
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Alpha-Particle-Induced Soft Error Rate in VLSI Circuits
- George A. Sai-Halasz
- Matthew R. Wordeman
- et al.
- 1982
- IEEE Journal of Solid-State Circuits
IIA-1 Generalized Scaling Theory and its Application to a 1/4 Micron Mosfet Design
- G. Baccarani
- M.R. Wordeman
- et al.
- 1982
- IEEE T-ED
Alpha-Particle-Induced Soft Error Rate in VLSI Circuits
- George A. Sai-Halasz
- Matthew R. Wordeman
- et al.
- 1982
- IEEE T-ED
A 34 µ m2 DRAM Cell Fabricated with a 1 µm Single-Level Polycide FET Technology
- Hu H. Chao
- Robert H. Dennard
- et al.
- 1981
- IEEE Journal of Solid-State Circuits
Threshold Voltage Characteristics of Depletion-Mode MOSFET's
- Matthew R. Wordeman
- Robert H. Dennard
- 1981
- IEEE T-ED