Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011
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25 results for Aditya Bansal
Bias Temperature Instability model for digital circuits - Predicting instantaneous FET response
- Aditya Bansal
- Kai Zhao
- et al.
- 2011
- IRPS 2011
Double-Gate MOSFETs with aymmetric drain underlap: A device-circuit co-design and optimization perspective for SRAM
- Ashish Goel
- Sumeet Gupta
- et al.
- 2009
- DRC 2009
Yield estimation of SRAM circuits using "Virtual SRAM Fab"
- Aditya Bansal
- Rama N. Singh
- et al.
- 2009
- ICCAD 2009
Impact of NBTI and PBTI in SRAM bit-cells: Relative sensitivities and guidelines for application-specific target stability/performance
- Aditya Bansal
- Rahul Rao
- et al.
- 2009
- IRPS 2009
Pre-Si estimation and compensation of SRAM layout deficiencies to achieve target performance and yield
- Aditya Bansal
- Rama N. Singh
- et al.
- 2008
- ICCD 2008
Optimal dual-VT design in sub-100 nanometer PDSOI and double-gate technologies
- Aditya Bansal
- Jae-Joon Kim
- et al.
- 2008
- VLSID 2008
High-performance device optimization and dual-VT technology options for doublegate FET
- Aditya Bansal
- Keunwoo Kim
- et al.
- 2007
- ICICDT 2007
Accurate modeling and analysis of currents in trapezoidal FinFET devices
- R.M. Rao
- A. Bansal
- et al.
- 2007
- SOI 2007
Circuit and physical design of the zenterprise™ ec12 microprocessor chips and multi-chip module
- James Warnock
- Yuen Chan
- et al.
- 2014
- IEEE Journal of Solid-State Circuits