Transistor-limited constant voltage stress of gate dielectrics
- B.P. Linder
- D.J. Frank
- et al.
- 2001
- VLSI Technology 2001
Publications
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104 results for David J. Frank
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Monte Carlo modeling of threshold variation due to dopant fluctuations
- D.J. Frank
- Y. Taur
- et al.
- 1999
- VLSI Technology 1999
Monte Carlo modeling of threshold variation due to dopant fluctuations
- D.J. Frank
- Y. Taur
- et al.
- 1999
- VLSI Circuits 1999
Comparison of high speed voltage-scaled conventional and adiabatic circuits
- D.J. Frank
- 1996
- LPED 1996
Comparison of high speed voltage-scaled conventional and adiabatic circuits
- D.J. Frank
- 1996
- LPED 1996
Power measurements of adiabatic circuits by thermoelectric technique
- P. Solomon
- D.J. Frank
- 1995
- LPE 1995
Electroid-oriented adiabatic switching circuits
- D.J. Frank
- P. Solomon
- 1995
- ISLPED 1995
Monte carlo simulations of p- And n-channel dual-gate Si MOSFETs at the limits of scaling
- D.J. Frank
- S.E. Laux
- et al.
- 1993
- Device Research Conference 1993