Power-constrained device and technology design for the end of scaling
- David J. Frank
- 2002
- IEDM 2002
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107 results for David J. Frank
Voltage dependence of hard breakdown growth and the reliability implication in thin dielectrics
- Barry P. Linder
- Salvatore Lombardo
- et al.
- 2002
- IEEE Electron Device Letters
Supply voltage strategies for minimizing the power of CMOS processors
- Jin Cai
- Yuan Taur
- et al.
- 2002
- VLSI Technology 2002
Design considerations for CMOS near the limits of scaling
- David J. Frank
- Yuan Taur
- 2002
- Solid-State Electronics
Power-constrained CMOS scaling limits
- David J. Frank
- 2002
- IBM J. Res. Dev
Transistor-limited constant voltage stress of gate dielectrics
- B.P. Linder
- D.J. Frank
- et al.
- 2001
- VLSI Technology 2001
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Device scaling limits of Si MOSFETs and their application dependencies
- David J. Frank
- Robert H. Dennard
- et al.
- 2001
- Proceedings of the IEEE
Analysis of the design space available for high-k gate dielectrics in nanoscale MOSFETs
- David J. Frank
- Hon-Sum P. Wong
- 2000
- Superlattices and Microstructures