A porous SiCOH dielectric with k=2.4 for high performance BEOL interconnects
- S. Gates
- A. Grill
- et al.
- 2006
- ADMETA 2006
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28 results for Robert Wisnieff
65nm Cu integration and interconnect reliability in low stress K=2.75 SiCOH
- V. McGahay
- G. Bonilla
- et al.
- 2006
- IITC 2006
BEOL interconnects for 45 nm node and beyond
- R.R. Yu
- J. Doyle
- et al.
- 2005
- VMIC 2005
AMLCD design
- Robert L. Wisnieff
- 1995
- AMLCD 1995
Modelling and simulation of TFT-LC arrays
- Robert L. Wisnieff
- 1990
- SSDM 1990
Eliminating crosstalk in thin film transistor/liquid crystal displays
- W.E. Howard
- P.M. Alt
- et al.
- 1987
- EURODISPLAY 1987
Lift-off process to build edge junction MIM active device arrays
- Robert L. Wisnieff
- Alan Lien
- et al.
- 1987
- EURODISPLAY 1987
Effect of SiC wafer miscut angle on the morphology and Hall mobility of epitaxially grown graphene
- Christos Dimitrakopoulos
- Alfred Grill
- et al.
- 2011
- Applied Physics Letters
Multilayer epitaxial graphene formed by pyrolysis of polycrystalline silicon-carbide grown on c-plane sapphire substrates
- Timothy J. Mcardle
- Jack O. Chu
- et al.
- 2011
- Applied Physics Letters
Wafer-scale epitaxial graphene growth on the Si-face of hexagonal SiC (0001) for high frequency transistors
- Christos Dimitrakopoulos
- Yu-Ming Lin
- et al.
- 2010
- Journal of Vacuum Science and Technology B